New opportunities in X-ray tomography

نویسندگان

  • A. G. Peele
  • H. M. Quiney
  • B. B. Dhal
  • A. P. Mancuso
  • K. A. Nugent
چکیده

We discuss standard X-ray-imaging techniques. Phase-imaging methods and a new class of nano-focus and nanoresolution laboratory systems offer new opportunities in true laboratory-based X-ray microtomography with a host of possible applications that have mainly been demonstrated only at synchrotron sources. Notwithstanding these advances, the diffraction limit for X-ray-imaging methods is a long way off. We preview the link between highresolution ‘standard’ imaging schemes and the new field of coherent diffractive imaging. r 2006 Elsevier Ltd. All rights reserved. PACS: 2.30.Rx; 41.50+h; 87.59 e

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تاریخ انتشار 2005